Hitachi IGBT Module Application Manual
7.3.1 Examples of Possible Failure Mechanisms
Figure 59 shows a graphical representation for possible failure mechanisms within an IGBT module.
Figure 59. Possible Failure Mechanisms for an IGBT Module
7.3.2 Acceptable Characteristics Limits after Quality Testing
(1)
(2)
(3)
I
ces
, I
ges
< 2.0 times rated value.
V
ce
(sat), V
f
< 1.2 times rated value.
R
th
( j - c )
< 1.5 times rated value.
7.3.3 Sample Testing Criteria
(1) Number of Samples --- 6 pieces for each test
(2) Number of Rejects --- 0 Rejects allowed
7.3.4 Frequency of Sample Testing
(1) Initial development stage for final design (Type test)
(2) Once per final design module, substitute similar design modules data for module testing result.
57
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